![](/img/cover-not-exists.png)
[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - Resisitive switching variability study on 1T1R AlOx/WOx-based RRAM array
Bin Jiao,, Ning Deng,, Jie Yu,, Bai, Yue, Minghao Wu,, Ye Zhang,, He Qian,, Huaqiang Wu,Year:
2013
Language:
english
DOI:
10.1109/edssc.2013.6628071
File:
PDF, 750 KB
english, 2013