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Detection of small atom numbers through image processing
Ockeloen, C. F., Tauschinsky, A. F., Spreeuw, R. J. C., Whitlock, S.Volume:
82
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.82.061606
Date:
December, 2010
File:
PDF, 367 KB
english, 2010