High-resolution near-field spectroscopy investigation of...

  • Main
  • High-resolution near-field spectroscopy...

High-resolution near-field spectroscopy investigation of GaN laterally overgrown structures on SiC

F. Hitzel, A. Hangleiter, S. Miller, A. Weimar, G. Brüderl, A. Lell, V. Härle
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2003
Language:
english
DOI:
10.1063/1.1580997
File:
PDF, 487 KB
english, 2003
Conversion to is in progress
Conversion to is failed