High-resolution near-field spectroscopy investigation of GaN laterally overgrown structures on SiC
F. Hitzel, A. Hangleiter, S. Miller, A. Weimar, G. Brüderl, A. Lell, V. HärleYear:
2003
Language:
english
DOI:
10.1063/1.1580997
File:
PDF, 487 KB
english, 2003