thin films by hard x-ray photoelectron spectroscopy
Paul, M., Müller, A., Ruff, A., Schmid, B., Berner, G., Mertin, M., Sing, M., Claessen, R.Volume:
79
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.79.233101
Date:
June, 2009
File:
PDF, 264 KB
english, 2009