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Quantitative lattice measurement of thin Langmuir-Blodgett films by atomic-force microscopy
Schwartz, D. K., Garnaes, J., Viswanathan, R., Chiruvolu, S., Zasadzinski, J. A. N.Volume:
47
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.47.452
Date:
January, 1993
File:
PDF, 3.78 MB
1993