Ultrasonic imaging and characterisation of surface breaking cracks in silicon nitride by leaky Rayleigh waves
P. Lemaitre, V. Buglino, F. Lakestani, R. DenisVolume:
12
Year:
1993
Language:
english
Pages:
11
DOI:
10.1016/0955-2219(93)90067-2
File:
PDF, 1013 KB
english, 1993