[IEEE 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST) - Tsinghua University (2007.06.3-2007.06.4)] 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST) - The degradation of reading performance in SONOS Flash Memory with small threshold voltage window
Shi, Kai, Xu, Ming-Zhen, Tan, Chang-HuaYear:
2007
Language:
english
DOI:
10.1109/edst.2007.4289798
File:
PDF, 199 KB
english, 2007