Investigation of low-temperature I-V curves of high-quality...

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Investigation of low-temperature I-V curves of high-quality Nb/Al-AlOx/Nb Josephson junctions

R. Monaco, R. Cristiano, L. Frunzio, C. Nappi
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Year:
1992
Language:
english
DOI:
10.1063/1.351175
File:
PDF, 812 KB
english, 1992
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