Surface Relaxations, Current Enhancements, and Absolute Distances in High Resolution Scanning Tunneling Microscopy
Hofer, W. A., Fisher, A. J., Wolkow, R. A., Grütter, P.Volume:
87
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.87.236104
Date:
November, 2001
File:
PDF, 101 KB
english, 2001