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Stoichiometry of Nanocrystalline VOx Thin Films Determined by Electron Energy Loss Spectroscopy
Li, J, Gauntt, BD, Kulik, J, Dickey, ECVolume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927609092770
Date:
July, 2009
File:
PDF, 2.06 MB
english, 2009