Scanning tunneling microscopy contrast in lateral Ge-Si...

Scanning tunneling microscopy contrast in lateral Ge-Si nanostructures on

Mysliveček, Josef, Dvořák, Filip, Stróżecka, Anna, Voigtländer, Bert
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
81
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.81.245427
Date:
June, 2010
File:
PDF, 537 KB
english, 2010
Conversion to is in progress
Conversion to is failed