films studied by x-ray diffraction

Physical Review B 2008 / 10 Vol. 78; Iss. 16

films studied by x-ray diffraction

O’Malley, S. M., Bonanno, P. L., Ahn, K. H., Sirenko, A. A., Kazimirov, A., Tanimura, M., Asada, T., Park, S., Horibe, Y., Cheong, S-W.
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Volume:
78
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.78.165424
Date:
October, 2008
File:
PDF, 543 KB
english, 2008
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