![](/img/cover-not-exists.png)
[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - Substrate modeling and lumped substrate resistance extraction for CMOS ESD/latchup circuit simulation
Li, Tong, Tsai, Ching-Han, Rosenbaum, Elyse, Kang, Sung-MoYear:
1999
Language:
english
DOI:
10.1145/309847.309996
File:
PDF, 827 KB
english, 1999