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[IEEE 16th International Reliability Physics Symposium - San Diego, CA, USA (1978.04.18-1978.04.20)] 16th International Reliability Physics Symposium - Degradation of PVF2 Capacitors During Accelerated Tests
Burough, J. W., Brammer, W. G., Burnham, JohnYear:
1978
Language:
english
DOI:
10.1109/irps.1978.362849
File:
PDF, 4.54 MB
english, 1978