Single event effect ground test results for a fiber optic data interconnect and associated electronics
LaBel, K.A., Hawkins, D.K., Cooley, J.A., Seidleck, C.M., Marshall, P., Dale, C., Gates, M.M., Kim, H.S., Stassinopoulos, E.G.Volume:
41
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.340535
Date:
December, 1994
File:
PDF, 421 KB
english, 1994