Self-organized criticality in a hierarchical model of...

Physical Review E 1996 / 4 Vol. 53; Iss. 4

Self-organized criticality in a hierarchical model of defects development

Blanter, E. M., Shnirman, M. G.
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Volume:
53
Journal:
Physical Review E
DOI:
10.1103/PhysRevE.53.3408
Date:
April, 1996
File:
PDF, 806 KB
1996
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