A method to correct for leakage current effects in deep...

Journal of Applied Physics 1993 Vol. 74; Iss. 6

A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes

Dmowski, K., Lepley, B., Losson, E., Bouabdellati, M. El
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
74
Year:
1993
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.354460
File:
PDF, 1.01 MB
english, 1993
Conversion to is in progress
Conversion to is failed