Depth Magnetization Profile of a Perpendicular Exchange...

Physical Review Letters 2008 / 4 Vol. 100; Iss. 15

Depth Magnetization Profile of a Perpendicular Exchange Coupled System by Soft-X-Ray Resonant Magnetic Reflectivity

Tonnerre, J. M., De Santis, M., Grenier, S., Tolentino, H. C. N., Langlais, V., Bontempi, E., García-Fernández, M., Staub, U.
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Volume:
100
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.100.157202
Date:
April, 2008
File:
PDF, 404 KB
english, 2008
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