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Analyzing noise robustness of wide fan-in dynamic logic gates under process variations
Frustaci, Fabio, Lanuzza, Marco, Perri, Stefania, Corsonello, PasqualeVolume:
42
Language:
english
Journal:
International Journal of Circuit Theory and Applications
DOI:
10.1002/cta.1862
Date:
May, 2014
File:
PDF, 2.32 MB
english, 2014