Simulation study of the atomic resolution secondary...

Surface and Interface Analysis 2014 / 12 Vol. 46; Iss. 12-13

Simulation study of the atomic resolution secondary electron imaging

Ruan, Z., Zhang, M., Zeng, R. G., Ming, Y., Da, B., Mao, S. F., Ding, Z. J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5565
Date:
December, 2014
File:
PDF, 1.26 MB
english, 2014
Conversion to is in progress
Conversion to is failed