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[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Timing Vulnerability Factors of Ultra Deep-sub-micron CMOS
Ghahroodi, Massoud Mokhtarpour, Zwolinski, Mark, Wong, Rick, Wen, Shi-JieYear:
2011
Language:
english
DOI:
10.1109/ets.2011.40
File:
PDF, 98 KB
english, 2011