Depth profiling by particle-induced x-ray emission analysis...

Depth profiling by particle-induced x-ray emission analysis using a parameter-fitting technique

Yamada, Kenichi, Kido, Yoshiaki
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Volume:
62
Year:
1987
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.339213
File:
PDF, 642 KB
english, 1987
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