![](/img/cover-not-exists.png)
Depth profiling by particle-induced x-ray emission analysis using a parameter-fitting technique
Yamada, Kenichi, Kido, YoshiakiVolume:
62
Year:
1987
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.339213
File:
PDF, 642 KB
english, 1987