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[IEEE 1999 IEEE International SOI Conference. Proceedings - Rohnert Park, CA, USA (4-7 Oct. 1999)] 1999 IEEE International SOI Conference. Proceedings (Cat. No.99CH36345) - Electrostatic discharge protection in silicon-on-insulator technology

Voldman, S., Hui, D., Warriner, L., Young, D., Williams, R., Howard, J., Gross, V., Rausch, W., Leobangdung, E., Sherony, M., Rohrer, N., Akrout, C., Assaderaghi, F., Shahidi, G.
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Year:
1999
Language:
english
DOI:
10.1109/soi.1999.819858
File:
PDF, 242 KB
english, 1999
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