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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs
Bahukudumbi, Sudarshan, Chakrabarty, KrishnenduYear:
2006
Language:
english
DOI:
10.1109/test.2006.297646
File:
PDF, 932 KB
english, 2006