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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Determination of trap energy levels in AlGaN/GaN HEMT
Yang, Jie, Cui, Sharon, Ma, T. P., Hung, Ting-Hsiang, Nath, Digbijoy, Krishnamoorthy, Sriram, Rajan, SiddharthYear:
2013
Language:
english
DOI:
10.1109/drc.2013.6633802
File:
PDF, 1.01 MB
english, 2013