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Frequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: The dip-df mode
Rode, Sebastian, Schreiber, Martin, Kühnle, Angelika, Rahe, PhilippVolume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4871436
Date:
April, 2014
File:
PDF, 1.15 MB
english, 2014