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Relation between the critical current and the n value of ReBCO thin films: A scaling law for flux pinning of ReBCO thin films
Oh, Sangjun, Choi, Heekyung, Lee, Chulhee, Lee, Sangmoo, Yoo, Jaeun, Youm, Dojun, Yamada, H., Yamasaki, H.Volume:
102
Year:
2007
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2769285
File:
PDF, 2.21 MB
english, 2007