Submicroscopic Structure Determination by Long Wavelength...

Submicroscopic Structure Determination by Long Wavelength X-Ray Diffraction

Henke, Burton L., DuMond, Jesse W. M.
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Volume:
26
Year:
1955
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1722117
File:
PDF, 1.56 MB
english, 1955
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