Control of the in-plane epitaxy for bi-epitaxial grain boundary junctions using a new multilayer structure
Li, M. Y., Kao, H. L., Chang, W. J., Lin, C. L., Chi, C. C., Guan, Weiyan, Wu, M. K.Volume:
77
Year:
1995
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.359557
File:
PDF, 818 KB
english, 1995