Method for measurement of the thermal diffusivity in solids: Application to metals, semiconductors, and thin materials
Calderón, A., Muñoz Hernández, R. A., Tomás, S. A., Cruz-Orea, A., Sánchez Sinencio, F.Volume:
84
Year:
1998
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.368957
File:
PDF, 294 KB
english, 1998