Shallow defect levels in neutron-irradiated p-type...

Journal of Applied Physics 1979 Vol. 50; Iss. 5

Shallow defect levels in neutron-irradiated p-type extrinsic silicon

Young, M. H., Marsh, O.J., Baron, R.
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Volume:
50
Year:
1979
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.326285
File:
PDF, 443 KB
english, 1979
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