Impact ionization thresholds in GexSi1−x alloys and strained layers
Czajkowski, I. K., Allam, J., Adams, A. R., Gell, M. A.Volume:
71
Year:
1992
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.350897
File:
PDF, 996 KB
english, 1992