Interpretation of recombination at c-Si/SiN[sub x]...

Journal of Applied Physics 2010 Vol. 108; Iss. 1

Interpretation of recombination at c-Si/SiN[sub x] interfaces by surface damage

Steingrube, Silke, Altermatt, Pietro P., Steingrube, Daniel S., Schmidt, Jan, Brendel, Rolf
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
108
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3437643
File:
PDF, 993 KB
english, 2010
Conversion to is in progress
Conversion to is failed