![](/img/cover-not-exists.png)
Direct imaging of the depletion region of an InP p–n junction under bias using scanning voltage microscopy
Ban, D., Sargent, E. H., Dixon-Warren, St. J., Calder, I., SpringThorpe, A. J., Dworschak, R., Este, G., White, J. K.Volume:
81
Year:
2002
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1528277
File:
PDF, 363 KB
english, 2002