Direct imaging of the depletion region of an InP p–n...

Direct imaging of the depletion region of an InP p–n junction under bias using scanning voltage microscopy

Ban, D., Sargent, E. H., Dixon-Warren, St. J., Calder, I., SpringThorpe, A. J., Dworschak, R., Este, G., White, J. K.
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Volume:
81
Year:
2002
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1528277
File:
PDF, 363 KB
english, 2002
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