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Intensity-voltage low-energy electron microscopy for functional materials characterization
Flege, Jan Ingo, Krasovskii, Eugene E.Volume:
8
Language:
english
Journal:
physica status solidi (RRL) - Rapid Research Letters
DOI:
10.1002/pssr.201409102
Date:
June, 2014
File:
PDF, 1.74 MB
english, 2014