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[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Detection of Transistor Stuck-Open Faults in Asynchronous Inputs of Scan Cells
Yang, Fan, Chakravarty, Sreejit, Devta-Prasanna, Narendra, Reddy, Sudhakar M., Pomeranz, IrithYear:
2008
Language:
english
DOI:
10.1109/dft.2008.11
File:
PDF, 367 KB
english, 2008