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[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Complementary Formal Approaches for Dependability Analysis
Baarir, Souheib, Braunstein, Cécile, Clavel, Renaud, Encrenaz, Emmanuelle, Ilié, Jean-Michel, Leveugle, Régis, Mounier, Isabelle, Pierre, Laurence, Poitrenaud, DenisYear:
2009
Language:
english
DOI:
10.1109/dft.2009.21
File:
PDF, 349 KB
english, 2009