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[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Building a test schedule for automotive microsystems using accelerated testing models
Ilian, V.E., Dragan, M., Bazu, M., Socol, G.Year:
2001
Language:
english
DOI:
10.1109/smicnd.2001.967494
File:
PDF, 318 KB
english, 2001