Characterization of the Li beam probe with a beam profile...

Review of Scientific Instruments 2010 Vol. 81; Iss. 10

Characterization of the Li beam probe with a beam profile monitor on JET

Nedzelskiy, I. S., Korotkov, A., Brix, M., Morgan, P., Vince, J., JET EFDA Contributors,
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Volume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3502328
File:
PDF, 717 KB
english, 2010
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