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[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Couple passive voltage contrast with scanning probe microscope to identify invisible defect out
Cha-Ming Shen,, Jing-Hong Chou,Year:
2005
Language:
english
DOI:
10.1109/ipfa.2005.1469181
File:
PDF, 382 KB
english, 2005