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[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Surface recombination/generation velocity in metal-oxide-silicon field-effect transistors

Zuhui Chen,, Xing Zhou,, Guojun Zhu,, Shihuan Lin,
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Year:
2009
Language:
english
DOI:
10.1109/edssc.2009.5394175
File:
PDF, 4.45 MB
english, 2009
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