![](/img/cover-not-exists.png)
[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Surface recombination/generation velocity in metal-oxide-silicon field-effect transistors
Zuhui Chen,, Xing Zhou,, Guojun Zhu,, Shihuan Lin,Year:
2009
Language:
english
DOI:
10.1109/edssc.2009.5394175
File:
PDF, 4.45 MB
english, 2009