[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Reliability testing and Failure Analysis of 3D integrated systems
Klumpp, Armin, Ramm, Peter, Franz, German, Rue, Chad, Kwakman, LaurensYear:
2011
Language:
english
DOI:
10.1109/iitc.2011.5940362
File:
PDF, 1.03 MB
english, 2011