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[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Radiation exposure induced failure on semiconductor package material
Yusoff, Wan Yusmawati Wan, Jalar, Azman, Othman, Norinsan Kamil, Rahman, Irman Abdul, Shamsudin, Roslinda, Hamid, Muhammad Azmi AbdulYear:
2012
Language:
english
DOI:
10.1109/smelec.2012.6417218
File:
PDF, 969 KB
english, 2012