Study of bending reliability and electrical properties of...

Microelectronics Reliability 2014 / 11 Vol. 54; Iss. 11

Study of bending reliability and electrical properties of platinum lines on flexible polyimide substrates

Molina-Lopez, F., de Araújo, R.E., Jarrier, M., Courbat, J., Briand, D., de Rooij, N.F.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.06.015
Date:
November, 2014
File:
PDF, 1.63 MB
english, 2014
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