![](/img/cover-not-exists.png)
[IEEE 2007 International Conference on Computer Engineering & Systems - Cairo, Egypt (2007.11.27-2007.11.29)] 2007 International Conference on Computer Engineering & Systems - Characterization of barrier height due to metal for Schottky barrier diode
Tayel, Mazhar B., El-Shawarby, Ayman M.Year:
2007
Language:
english
DOI:
10.1109/icces.2007.4447057
File:
PDF, 181 KB
english, 2007