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Zn drops at a Si surface measured by the refracted x-ray fluorescence method
Sasaki, Y. C., Kisimoto, M., Nagata, S., Yamaguchi, S., Hirokawa, K.Volume:
69
Year:
1991
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.347411
File:
PDF, 526 KB
english, 1991