Recovery of the MOSFET and Circuit Functionality After the...

IEEE Electron Device Letters 2010 / 06 Vol. 31; Iss. 6

Recovery of the MOSFET and Circuit Functionality After the Dielectric Breakdown of Ultrathin High-$k$ Gate Stacks

Crespo-Yepes, A, Martin-Martinez, J, Rothschild, A, Rodriguez, R, Nafria, M, Aymerich, X
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Volume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2045732
Date:
June, 2010
File:
PDF, 249 KB
english, 2010
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