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[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - Low Dose Rate Test Results for National Semiconductor's ELDRS-Free LM136-2.5 Bipolar Reference
Kruckmeyer, Kirby, McGee, Larry, Brown, Bill, Miller, LindaYear:
2009
Language:
english
DOI:
10.1109/redw.2009.5336314
File:
PDF, 684 KB
english, 2009