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Variability-Aware Parametric Yield Estimation for Analog/Mixed-Signal Circuits: Concepts, Algorithms, and Challenges
Fang Gong,, Hao Yu,, Yiyu Shi,, Lei He,Volume:
31
Language:
english
Journal:
IEEE Design & Test
DOI:
10.1109/mdat.2014.2299279
Date:
August, 2014
File:
PDF, 928 KB
english, 2014