Resonance Raman spectroscopy in Si and C ion-implanted...

Physical Review B 2009 / 10 Vol. 80; Iss. 15

Resonance Raman spectroscopy in Si and C ion-implanted double-wall carbon nanotubes

Saraiva, G. D., Souza Filho, A. G., Braunstein, G., Barros, E. B., Mendes Filho, J., Moreira, E. C., Fagan, S. B., Baptista, D. L., Kim, Y. A., Muramatsu, H., Endo, M., Dresselhaus, M. S.
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Volume:
80
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.80.155452
Date:
October, 2009
File:
PDF, 846 KB
english, 2009
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